# Publication

id: cms8m86sp000egqo0cidqqf98
title: POWER: Program Option-Aware Fuzzer for High Bug Detection Ability
authors: Lee, Ahcheong, Ariq, Irfan, Kim, Yunho, Kim, Moonzoo
venue: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST)
tags: []
url: https://doi.ieeecomputersociety.org/10.1109/ICST53961.2022.00032
doiUrl: https://doi.org/10.1109/ICST53961.2022.00032
pdfUrl:
  https://swtv.kaist.ac.kr/files/publications/international_conference/POWER-IEEEeXpress-2022017668.pdf


id: cms8m86sw000igqo0hn7wamfe
authors: Yunho Kim, Dongju Lee, Junki Baek, Moonzoo Kim
venue: Information and Software Technology
tags: []
url: https://www.sciencedirect.com/science/article/pii/S0950584919302332
doiUrl: https://doi.org/10.1016/j.infsof.2019.106221
title:
  MAESTRO: Automated test generation framework for high test coverage and reduced human effort in automotive industry

pdfUrl:
  https://www.sciencedirect.com/science/article/pii/S0950584919302332/pdfft?md5=5950a0715e7491fabd5d369093d3e650&pid=1-s2.0-S0950584919302332-main.pdf


id: cms8m86t0000kgqo0bmq1soiy
title: Concolic Testing for High Test Coverage and Reduced Human Effort in Automotive Industry
authors: Kim, Yunho, Lee, Dongju, Baek, Junki, Kim, Moonzoo
tags: []
url: https://ieeexplore.ieee.org/abstract/document/8804440
pdfUrl: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8804440
doiUrl: https://doi.org/10.1109/ICSE-SEIP.2019.00024
venue:
  2019 IEEE/ACM 41st International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)


id: cms8m86t1000lgqo0xo0lgx11
authors: Kim, Yunho, Hong, Shin, Kim, Moonzoo
tags: []
url: https://doi.org/10.1145/3338906.3338934
pdfUrl: https://dl.acm.org/doi/pdf/10.1145/3338906.3338934
doiUrl: https://doi.org/10.1145/3338906.3338934
title:
  Target-driven compositional concolic testing with function summary refinement for effective bug detection

venue:
  Proceedings of the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering


id: cms8m86t4000ngqo0en2y5pqk
title: MUSIC: Mutation Analysis Tool with High Configurability and Extensibility
authors: Phan, Duy Loc, Kim, Yunho, Kim, Moonzoo
tags: []
url: https://ieeexplore.ieee.org/abstract/document/8411729
pdfUrl: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8411729
doiUrl: https://doi.org/10.1109/ICSTW.2018.00026
venue:
  2018 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)


id: cms8m86t5000ogqo0xxgwuy4w
authors: Kim, Yunho, Hong, Shin, Ko, Bongseok, Phan, Duy Loc, Kim, Moonzoo
venue: 2018 IEEE 11th International Conference on Software Testing, Verification and Validation (ICST)
tags: []
url: https://ieeexplore.ieee.org/abstract/document/8367052
pdfUrl: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8367052
doiUrl: https://doi.org/10.1109/ICST.2018.00032
title:
  Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage


id: cms8m86t7000pgqo03km79a8o
title: MUSEUM: Debugging real-world multilingual programs using mutation analysis
authors: Shin Hong, Taehoon Kwak, Byeongcheol Lee, Yiru Jeon, Bongseok Ko, Yunho Kim, Moonzoo Kim
venue: Information and Software Technology
tags: []
url: https://www.sciencedirect.com/science/article/pii/S0950584916302427
doiUrl: https://doi.org/10.1016/j.infsof.2016.10.002
pdfUrl:
  https://www.sciencedirect.com/science/article/pii/S0950584916302427/pdfft?md5=564cc8660b37b039fd413ed8b4b201dc&pid=1-s2.0-S0950584916302427-main.pdf


id: cms8m86tg000wgqo0dbkzubaw
authors: Kim, Yunho, Kim, Moonzoo, Kim, Young Joo, Jang, Yoonkyu
venue: 2012 34th International Conference on Software Engineering (ICSE)
tags: []
url: https://ieeexplore.ieee.org/abstract/document/6227105
pdfUrl: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6227105
doiUrl: https://doi.org/10.1109/ICSE.2012.6227105
title:
  Industrial application of concolic testing approach: A case study on libexif by using CREST-BV and KLEE


id: cms8m86to0012gqo08jptfjcw
title: SCORE: a scalable concolic testing tool for reliable embedded software
authors: Kim, Yunho, Kim, Moonzoo
tags: []
url: https://doi.org/10.1145/2025113.2025180
pdfUrl: https://dl.acm.org/doi/pdf/10.1145/2025113.2025180
doiUrl: https://doi.org/10.1145/2025113.2025180
venue:
  Proceedings of the 19th ACM SIGSOFT Symposium and the 13th European Conference on Foundations of Software Engineering


id: cms8m86tp0013gqo0fcpr5ard
title: Directed test suite augmentation: techniques and tradeoffs
authors: Xu, Zhihong, Kim, Yunho, Kim, Moonzoo, Rothermel, Gregg, Cohen, Myra B.
tags: []
url: https://doi.org/10.1145/1882291.1882330
pdfUrl: https://dl.acm.org/doi/pdf/10.1145/1882291.1882330
doiUrl: https://doi.org/10.1145/1882291.1882330
venue:
  Proceedings of the Eighteenth ACM SIGSOFT International Symposium on Foundations of Software Engineering


id: cms8m86tt0016gqo0ll9qsw1a
title: Concolic Testing of the Multi-sector Read Operation for Flash Memory File System
authors: Kim, Moonzoo, Kim, Yunho
venue: Formal Methods: Foundations and Applications
tags: []
url: https://link.springer.com/chapter/10.1007/978-3-642-10452-7_17
doiUrl: https://doi.org/10.1007/978-3-642-10452-7_17
pdfUrl:
  https://www.researchgate.net/profile/Yunho-Kim/publication/221136356_Concolic_Testing_of_the_Multi-sector_Read_Operation_for_Flash_Memory_File_System/links/00b4953ca38ffc7e75000000/Concolic-Testing-of-the-Multi-sector-Read-Operation-for-Flash-Memory-File-System.pdf


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